Phase, microstructure and microwave dielectric properties of Mg0:95Ni0:05Ti0:98Zr0:02O3 ceramics

Abstract

Abstract Mg0:95Ni0:05Ti0:98Zr0:02O3 ceramics was prepared via conventional solid-state mixed-oxide route. The phase, microstructure and microwave dielectric properties of the sintered samples were characterized using X-ray diffraction (XRD), scanning electron microscopy (SEM) and a vector network analyzer. The microstructure comprised of circular and elongated plate-like grains. The semi quantitative analysis (EDS) of the circular and elongated grains revealed the existence of Mg0:95Ni0:05T2O5 as a secondary phase along with the parent Mg0:95Ni0:05Ti0:98Zr0:02O3 phase, which was consistent with the XRD findings. In the present study, εr ~17.1, Qufo~195855 ± 2550 GHz and τf ~ -46 ppm/K was achieved for the synthesized Mg0:95Ni0:05Ti0:98Zr0:02O3 ceramics sintered at 1325 °C for 4 h.