Messung hoher Elektronendichten mit einer neuartigen Mikrowellen-Reflexionssonde an einem linearen z-Pinch

Abstract

A microwave reflection probe method allowing the local measurement of electron densities well above the critical density is described. Measurements in the 35 Gc/s band on a z-pinch show its applicability. A rectangular waveguide with a dielectric aperture window serves as a probe. The interferometer for measuring the reflection coefficient is presented. It indicates phase angle and amplitude automatically without using modulators or frequency translators. Electron densities between about 1013 cm-3 and 1016 cm-3 could be measured, facilitated by the transforming action of a dielectric λ/4-window.