Conventional arrayed waveguide grating (CAWG) devices for high stability and low insertion loss in near infrared wavelength band

Author:

Leon Megalan Leo1,Samuel Rosaline2,Ahammad Shaik Hasane3,Meenakshisundaram Ramkumar Prabhu4,Hossain Md. Amzad56,Rashed Ahmed Nabih Zaki78ORCID

Affiliation:

1. Department of ECE , Sathyabama Institute of Science and Technology , Chennai , India

2. Department of ECE , R.M.K. Engineering College , Chennai , India

3. Department of ECE , Koneru Lakshmaiah Education Foundation , Vaddeswaram , Andhra Pradesh 522302 , India

4. Department of ECE , PERI Institute of Technology , Chennai , India

5. Institute of Theoretical Electrical Engineering, Faculty of Electrical Engineering and Information Technology, Ruhr University Bochum , 44801 Bochum , Germany

6. Department of Electrical and Electronic Engineering , Jashore University of Science and Technology , Jashore 7408 , Bangladesh

7. Electronics and Electrical Communications Engineering Department , Faculty of Electronic Engineering, Menoufia University , Menouf 32951 , Egypt

8. Department of VLSI Microelectronics , Institute of Electronics and Communication Engineering, Saveetha School of Engineering, SIMATS , Chennai 602105 , Tamilnadu , India

Abstract

Abstract This study has presented the different suggested compounds based (CAWG) like silicon dioxide (SiO2), lithium niobate (LiNbO3) and gallium aluminum arsenide (Ga(1-x)Al(x)As) taking into consideration their operating wavelength range, their operating temperature range, their physical properties, and also their ability to be used in the manufacture of optical devices. The optimum performance was given in case of using the following materials such as SiO2, LiNbO3 and Ga(1-x)Al(x)As materials, so these materials have been used as a proposed materials based CAWG devices, which have been investigated for high stability and low insertion loss in near infrared wavelength band. The comparison between these proposed materials are clarified through the design parameters of CAWG device such as the order of diffraction (m), path length adjacent waveguides difference (ΔL), focal length (L f ), free spectral range (FSR), max no. of I/O wavelength channels (N max), and arrayed waveguides (P) number.

Publisher

Walter de Gruyter GmbH

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics

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