Linearity test of triangular waveform generators
Author:
Alegria Francisco André Corrêa1ORCID
Affiliation:
1. Instituto de Telecomunicações/Instituto Superior Técnico, Technical University of Lisbon , Av. Rovisco Pais, 1049-001 Lisboa , Portugal
Abstract
Abstract
This paper presents a novel approach for accurately testing triangular waveform generators by leveraging the Ramp Vernier Test methodology commonly used for Analog-to-Digital Converters (ADCs). The proposed procedure enables efficient measurement of the nonlinearity of a triangular waveform using a low-cost data acquisition board. The key idea is to utilize the waveform generator under test to produce the stimulus signal for the data acquisition system’s testing. By analyzing the results of this test, the nonlinearity of the acquisition system can be determined and subsequently corrected. This approach effectively eliminates the influence of the acquisition system’s nonlinearity on the estimation of the nonlinearity of the waveform generator, ensuring accurate and reliable measurements.
Funder
Instituto de Telecomunicações
Publisher
Walter de Gruyter GmbH
Subject
Electrical and Electronic Engineering,Instrumentation
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