Microsphere-assisted interference microscopy for resolution enhancement-Reference-Cited by-同舟云学术

Microsphere-assisted interference microscopy for resolution enhancement

Published:2021-03-02 Issue:5 Volume:88 Page:311-318
ISSN:2196-7113
Container-title:tm - Technisches Messen
language:en
Short-container-title:

Author:

Hüser Lucie¹,Lehmann Peter¹

Affiliation:

1. Measurement Technology Group, Department of Electrical Engineering and Computer Science , 9178 University of Kassel , Wilhelmshöher Allee 71 , Kassel , Germany

Abstract

Abstract In order to push the limitations of optical measurement technology further and to measure finer structures, various systems have been published in current research. It has been shown that microspheres applied in the near-field can improve the resolution of an interferometric measuring system and make structures below Abbe’s resolution limit visible. In this study, measurement results obtained with a high-resolution Linnik interferometer show structures with lateral dimensions below the resolution limit. Furthermore, the analysis of the transfer behavior in the spatial frequency domain provides information about the mechanisms in nearfield-assisted interference microscopy by microspheres.

Publisher

Walter de Gruyter GmbH

Subject

Electrical and Electronic Engineering,Instrumentation

Link

https://www.degruyter.com/document/doi/10.1515/teme-2020-0101/pdf

Reference35 articles.

1. Z. Chen, A. Taflove, and V. Backman. Photonic nanojet enhancement of backscattering of light by nanoparticles: a potential novel visible-light ultramicroscopy technique. Optics Express, 12(7):1214, 2004. ISSN 1094-4087. 10.1364/OPEX.12.001214.

2. A. Darafsheh. Influence of the background medium on imaging performance of microsphere-assisted super-resolution microscopy. Optics Letters, 42(4):735, 2017. ISSN 0146-9592. 10.1364/OL.42.000735. URL https://www.osapublishing.org/abstract.cfm?URI=ol-42-4-735.

3. A. Darafsheh, G. F. Walsh, L. Dal Negro, and V. N. Astratov. Optical super-resolution by high-index liquid-immersed microspheres. Applied Physics Letters, 101(14):141128, 2012. ISSN 0003-6951. 10.1063/1.4757600.

4. A. Darafsheh, N. I. Limberopoulos, J. S. Derov, D. E. Walker, and V. N. Astratov. Advantages of microsphere-assisted super-resolution imaging technique over solid immersion lens and confocal microscopies. Applied Physics Letters, 104(6), 2014. ISSN 0003-6951. 10.1063/1.4864760.

5. M. Fleischer, R. Windecker, and H. J. Tiziani. Fast algorithms for data reduction in modern optical three-dimensional profile measurement systems with MMX technology. Applied Optics, 39(8):1290–1297, 2000. ISSN 0003-6935. 10.1364/ao.39.001290.

Cited by 10 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Design and fabrication of universal resolution targets for microsphere-assisted microscopy;Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXXI;2024-03-12

2. Microsphere-assisted microscopy: challenges and opportunities;Optical Measurement Systems for Industrial Inspection XIII;2023-08-15

3. Dielectric microspheres enhance microscopy resolution mainly due to increasing the effective numerical aperture;Light: Science & Applications;2023-01-11

4. Obtaining an Array of Closely Packed Mesoscale Spheres Using Dielectrophoresis Forces for Optical Super-Resolution Microscopy;2022 IEEE International Multi-Conference on Engineering, Computer and Information Sciences (SIBIRCON);2022-11-11

5. Microsphere assistance in interference microscopy with high numerical aperture objective lenses;Journal of Optical Microsystems;2022-10-28