Notizen: X-ray Topographic Determination of the Sense of Pure Screw Dislocations-Reference-Cited by-同舟云学术

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Notizen: X-ray Topographic Determination of the Sense of Pure Screw Dislocations

Published:1965-04-01 Issue:4 Volume:20 Page:636-638
ISSN:1865-7109
Container-title:Zeitschrift für Naturforschung A
language:
Short-container-title:

Author:

Lang A. R.¹

Affiliation:

1. 1H. H. Wills Physics Laboratory, University of Bristol, England

Publisher

Walter de Gruyter GmbH

Subject

Physical and Theoretical Chemistry,General Physics and Astronomy,Mathematical Physics

Link

https://www.degruyter.com/document/doi/10.1515/zna-1965-0427/pdf

Cited by 17 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. X-Ray Topography of Organic Crystals;Crystals;1991

2. Dynamical scattering of X-rays by dislocations in the Bragg and Laue case;Zeitschrift f�r Physik B Condensed Matter;1989-09

3. A fading effect in the X-ray diffraction contrast of dislocations;Zeitschrift für Physik B Condensed Matter;1988-09

4. The growth of dislocation-free crystals of benzil;Journal of Crystal Growth;1985-11

5. X-ray Diffraction Topography of Growth Defects in Crystals;Рост Кристаллоь / Rost Kristallov / Growth of Crystals;1984

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