An RRAM-based building block for reprogrammable non-uniform sampling ADCs

Author:

Vishwakarma Abhinav1,Fritscher Markus12,Hagelauer Amelie34,Reichenbach Marc1

Affiliation:

1. Brandenburgische Technische Universität, Cottbus–Senftenberg, Computer Engineering Institute , Konrad-Wachsmann-Allee 5, 03046 Cottbus , Germany

2. IHP – Leibniz Institute for High Performance Microelectronics , Im Technologiepark 25, 15236 Frankfurt (Oder) , Germany

3. Chair of Micro- and Nanosystems Technology , Technische Universität München , Munich , Germany

4. Fraunhofer EMFT Fraunhofer Institute for Electronic Microsystems and Solid State Technologies , Munich , Germany

Abstract

AbstractRRAM devices have recently seen wide-spread adoption into applications such as neural networks and storage elements since their inherent non-volatility and multi-bit-capability renders them a possible candidate for mitigating the von-Neumann bottleneck. Researchers often face difficulties when developing edge devices, since dealing with sensors detecting parameters such as humidity or temperature often requires large and power-consuming ADCs. We propose a possible mitigation, namely using a RRAM device in combination with a comparator circuit to form a basic block for threshold detection. This can be expanded towards programmable non-uniform sampling ADCs, significantly reducing both area and power consumption since significantly smaller bit-resolutions are required. We demonstrate how a comparator circuit designed in 130 nm technology can be reprogrammed by programming the incorporated RRAM device. Our proposed building block consumes 83 µW.

Funder

Deutsche Forschungsgemeinschaft

Publisher

Walter de Gruyter GmbH

Subject

General Computer Science

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