Author:
Klibanov Michael V.,Romanov Vladimir G.
Abstract
AbstractImaging of nano structures is necessary for the quality control in their manufacturing. In the case when X-rays probe the medium, only the modulus of the complex valued scattered wave field can be measured. The phase cannot be measured. In the case of the Born approximation, we obtain an explicit reconstruction formula for the unknown coefficient from the phaseless scattering data.
Cited by
23 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献