A method for the use of ellipticities and spot diameters for the measurement of aberrations in wide-field telescopes

Abstract

AbstractIn wide-field survey telescopes, the patterns of spot sizes and ellipticities can be used to determine wavefront aberrations generated by the telescope. The calculation of spot sizes and ellipticities generated by telescope aberrations is most conveniently done if the aberrations are expressed in terms of Zernike-type polynomials whose derivatives are orthonormal. The field dependence of the spot sizes and ellipticities generated by the telescope can conveniently be expressed by low-order Zernike polynomials. Because the exposure times in astronomical survey work are typically rather short, this information may be used for a quasi-closed loop control of the telescope optics. The ability to accurately subtract ellipticities generated by telescope errors could also be useful for observations such as gravitational lensing surveys.