Affiliation:
1. Technical University of Košice, Faculty of Mechanical Engineering, Department of Production Technique, Letná 9, 040 02 Košice Slovakia
2. Technical University of Košice, Faculty of Mechanical Engineering, Department of Biomedical Engineering and Measurement, Letná 9, 040 02 Košice Slovakia
Abstract
Abstract
The input of this paper lies in displaying possibilities how to determine the condition of a coordinate measuring machine (CMM) based on a large number of repeated measurements. The number of repeated measurements exceeds common requirements for determining positioning accuracy. The total offset in the accuracy of spatial positioning consists of partial inaccuracies of individual axes. 6 basic errors may be defined at each axis. In a triaxial set, that translates into 18 errors, to which an offset from the perpendicularity between the axial pairs must be added. Therefore, the combined number of errors in a single position is 21. These errors are systemic and stem from the machine’s geometry. In addition, there are accidental errors to account for as well. Accidental errors can be attributed to vibrations, mass inertness, passive resistance, and in part to fluctuations in temperature. A peculiar set of systemic errors are time-varying errors. The nature of those errors may be reversible, for instance if they result from influence of temperature or elastic deformation. They can be also irreversible, for example as a result of wear and tear or line clogging, due to loosened connection or permanent deformation of a part post collision. A demonstration of thermal equalizing of the machine’s parts may also be observed in case of failure to adhere to a sufficient time interval from the moment the air-conditioning is turned on. Repeated measurements done on a selected axis with linear interferometer can provide complex information on the CMM condition and also on the machine’s interaction with the given technical environment.
Subject
Instrumentation,Biomedical Engineering,Control and Systems Engineering
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