X-ray Emission Wavelengths of Argon, Krypton, Xenon, and Curium

Abstract

Abstract The wavelengths of the L series of argon, krypton and xenon, the K series of argon, and the M series of curium were measured by means of wavelength dispersive X-ray microanalysis. The specimens for the investigations were TiC layers which had been HF sputtered under reduced argon pressure by the PVD method, krypton and xenon implanted zeolites, and a curium doped borosilicate glass. The obtained relative intensities of the X-ray emission lines were normalized to the maximum intensity of the line of the respective series