Polycrystal Scattering Topography, Scattering Tomography and their Perspective Fields of Application

Abstract

A concept of X-ray topography for polycrystalline materials has been proposed. In this method X-rays scattered from a specimen produce the image. Various techniques for this kind of topo­graphy are described and their characteristic features are pointed out; some of these techniques offer the possibility to make tomographic observations. The new topographic method has been applied to the observation of commercially used alu­minium sheet and of wood (cedar). The discussion is extended to mechanisms of the image forma­tion and the perspective fields of application.