Affiliation:
1. Materials Department, University of California, Los Angeles
Abstract
Thin films of TiNx with controlled composition were prepared by means of reactive electronbeam evaporation. Their microspecular reflectance was measured as a function of both wavelength and deviation from stoichiometry. The correlation between the electrical and optical properties as suggested by Hagen-Rubens and Drude was demonstrated
Subject
Physical and Theoretical Chemistry,General Physics and Astronomy,Mathematical Physics
Cited by
3 articles.
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