Notizen: Fast Pulsed Laser Induced Electron Generation for Electron Impact Mass Spectrometry-Reference-Cited by-同舟云学术

Notizen: Fast Pulsed Laser Induced Electron Generation for Electron Impact Mass Spectrometry

Published:1988-12-01 Issue:12 Volume:43 Page:1151-1153
ISSN:1865-7109
Container-title:Zeitschrift für Naturforschung A
language:en
Short-container-title:

Author:

Rohwer E. R.¹²,Beavis R.C.¹³,Köster C.¹,Lindner J.¹,Grotemeyer J.¹,Schlag E. W.¹

Affiliation:

1. Institut für Physikalische und Theoretische Chemie, Technische Universität München. Garching, FRG

2. Permanent address: Institute for Chromatography, University of Pretoria. Pretoria 0002, Republic of South Africa.

3. Permanent address: Department of Chemistry, Rockefeller University. New York, USA.

Abstract

A new ultra fast electron impact (El) ion source is presented that produces a very short, high intensity electron beam, allowing medium resolution mass spectra to be recorded without pulsing the ion accelerating voltages in a time-of-flight mass spectrometer (TOF-MS). The ion source requires minimum modification of any TOF-MS equipped with an electrostatic ion reflector and UV-laser. El-spectra are presented for comparison with literature spectra.

Publisher

Walter de Gruyter GmbH

Subject

Physical and Theoretical Chemistry,General Physics and Astronomy,Mathematical Physics

Link

https://www.degruyter.com/document/doi/10.1515/zna-1988-1220/pdf

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