Mechanical Characterization of Nanostructured Thin Films Used to Imporve Mechatronic Components-Reference-Cited by-同舟云学术

Mechanical Characterization of Nanostructured Thin Films Used to Imporve Mechatronic Components

Published:2017-04-25 Issue:12 Volume:15 Page:48-54
ISSN:2537-3161
Container-title:Scientific Bulletin of Valahia University - Materials and Mechanics
language:en
Short-container-title:

Author:

Badita Liliana-Laura¹,Gheorghe Gheorghe¹,Bratu Vasile²,Gornoava Valentin¹,Vocurek Marian¹,Zapciu Aurel¹,Munteanu Iulian Sorin¹

Affiliation:

1. National Institute of Research and Development in Mechatronics and Measurement Technique, Pantelimon Road, No.6-8, Bucharest, Romania

2. Valahia University of Targoviste, Faculty of Materials Engineering and Mechanics, 13 Aleea Sinaia Street, Targoviste, Romania

Abstract

Abstract Taking into account the importance of mechatronic applications, researches regarding the possibility to improve the lifetime of mechatronic components were made. Nanostructured metallic thin films (Ti, Cr, Al and Ti/Al multilayer) were deposited on different types of steel substrates, because nanomaterials have exceptional properties in relation to the common materials. In this paper a part of the results obtained after mechanical and topographic characterization of the thin films are presented. Cr is the deposited thin film showing the highest hardness on the surface of steel substrate type OSC. After the scratch tests realized, Ti layer presented the best adhesion on all types of steel substrates used in experiments. The results of these researches could be extremely useful for engineers in the mechatronic field.

Publisher

Walter de Gruyter GmbH

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