Near infrared hyperspectral imaging-based approach for end-of-life flat monitors recycling

Author:

Bonifazi Giuseppe1,Gasbarrone Riccardo1,Palmieri Roberta1,Serranti Silvia1

Affiliation:

1. Department of Chemical Engineering, Materials and Environment , Sapienza – University of Rome , via Eudossiana 18 , Rome , Italy

Abstract

Abstract The technological innovation and the relentless marketing of new electronic products with improved performance generate increasing quantities of Waste from Electrical and Electronic Equipment (WEEE). In this scenario, End-Of-Life (EOL) flat monitors and screens represent a category generating, as a consequence of the rapid change in technology, an important amount of waste. Considering future estimations, the implementation of an adequate recycling infrastructure is necessary. An efficient, reliable and low-cost analytical tool is thus needed to perform detection/control actions in order to assess: i) waste composition and ii) physical-chemical attributes of the resulting materials. The knowledge of these information is a requirement to set-up and to implement correct recycling actions. In this study, a cascade identification approach, based on Near InfraRed (NIR) – HyperSpectral Imaging (HSI), was carried out. More in detail, a four-steps classification was designed, implemented and set-up in order to recognize different materials occurring in a specific WEEE stream: EOL milled monitors and flat screens. Adopting the proposed approach, different material categories are correctly recognized and classified. Obtained results can be useful not only to set-up a quality control system, but also to improve sorting actions in this specific recycling sector.

Publisher

Walter de Gruyter GmbH

Subject

Electrical and Electronic Engineering,Computer Science Applications,Control and Systems Engineering

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