Experimental demonstration of broadband negative refraction at visible frequencies by critical layer thickness analysis in a vertical hyperbolic metamaterial

Author:

Cho Hanlyun1ORCID,Yang Younghwan1ORCID,Lee Dasol12,So Sunae1ORCID,Rho Junsuk1345ORCID

Affiliation:

1. Department of Mechanical Engineering , Pohang University of Science and Technology (POSTECH) , Pohang , 37673 , Republic of Korea

2. Department of Biomedical Engineering , Yonsei University , Wonju , 26493 , Republic of Korea

3. Department of Chemical Engineering , Pohang University of Science and Technology (POSTECH) , Pohang , 37673 , Republic of Korea

4. POSCO-POSTECH-RIST Convergence Research Center for Flat Optics and Metaphotonics , Pohang , 37673 , Republic of Korea

5. National Institute of Nanomaterials Technology (NINT) , Pohang , 37673 , Republic of Korea

Abstract

Abstract This work presents a vertical hyperbolic metamaterial (vHMM) consisting of a vertically stacked metal-dielectric multilayer that operates in the visible spectrum. The vHMM is designed by exploiting the relation between negative refraction and effective permittivity along the perpendicular direction of the layers (ε ). When a vHMM has a high loss tangent defined by tan δ  ≡ Im(ε )/Re(ε ), even a vHMM composed of relatively thick layers can generate negative refraction. A fabricable vHMM composed of gold and copolymer resist (EL8) which exhibits negative refraction at the wavelengths between 450 and 550 nm is designed using critical layer thickness analysis. The largest negative refraction is observed at the wavelength of 500 nm, where the angle of refraction reaches −1.03°. The corresponding loss tangent and equivalent refractive index are 1.08 and −0.47, respectively. However, negative refraction is not observed at the wavelengths longer than 550 nm due to low tan δ . We uncover that the tan δ of a vHMM is the dominant condition for generating negative refraction rather than the ratio of layer thickness to wavelength.

Publisher

Walter de Gruyter GmbH

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials,Biotechnology

Cited by 21 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3