Author:
Nguyen-Van Thuan,Bui-Tien Thanh
Abstract
This paper presents a stochastic finite element method to calculate the variation of eigenvalues and eigenvectors of functionally graded beams. The modulus of functionally graded material is assumed to have spatial uncertainty as a one-dimensional random field. The formulation of the stochastic finite element method for the functionally graded beam due to the randomness of the elastic modulus of the beam is given using the first-order perturbation approach. This approach was validated with Monte Carlo simulation in previous studies using spectral representation to generate the random field. The statistics of the beam responses were investigated using the first-order perturbation method for different fluctuations of the elastic modulus. A comparison of the results of the stochastic finite element method with the first-order perturbation approach and the Monte Carlo simulation showed a minimal difference.
Publisher
Engineering, Technology & Applied Science Research
Reference32 articles.
1. L. T. Ha and N. T. K. Kue, "Free vibration of functionally graded porous nano beams," Transport and Communications Science Journal, vol. 70, no. 2, pp. 95–103, 2019.
2. B. Uymaz, "Buckling Characteristics of FGM Plates Subjected to Linearly Varying In-Plane Loads," Mechanics of Composite Materials, vol. 57, no. 1, pp. 69–80, Mar. 2021.
3. J. K. Lee and B. K. Lee, "Coupled Flexural-Torsional Free Vibration of an Axially Functionally Graded Circular Curved Beam," Mechanics of Composite Materials, vol. 57, no. 6, pp. 833–846, Jan. 2022.
4. H. D. Ta and P.-C. Nguyen, "Perturbation based stochastic isogeometric analysis for bending of functionally graded plates with the randomness of elastic modulus," Latin American Journal of Solids and Structures, vol. 17, Sep. 2020, Art. no. e306.
5. S. Kumar, D. Prakash, M. Muthtamilselvan, B. Abdalla, and Q. M. Al-Mdallal, "Flexural Waves in an Electrically Short Hard Dielectric and Functionally Graded Piezoelectric Layer," Mechanics of Solids, vol. 57, no. 3, pp. 671–681, Jun. 2022.