Growth Mode Study of MgCl2 on Ti (0001) and SiO2 under Ultra High Vacuum by XPS-Reference-Cited by-同舟云学术

Growth Mode Study of MgCl2 on Ti (0001) and SiO2 under Ultra High Vacuum by XPS

Published:2012-12-04 Issue:6 Volume:2 Page:291-294
ISSN:1792-8036
Container-title:Engineering, Technology & Applied Science Research
language:
Short-container-title:Eng. Technol. Appl. Sci. Res.

Author:

Karakalos S.

Abstract

The growth mode of MgCl2 on Ti (0001) and on SiO2 grown on Si (100) was investigated by X-ray Photoelectron Spectroscopy (XPS) under UHV conditions. Magnesium chloride grows on both Ti (0001) single crystal and SiO2 following the Frank-van der Merve, (FM) growth mode.

Publisher

Engineering, Technology & Applied Science Research

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