1. Aaraj, N, Nazer, A, Chehab and A., Kayssi, I. 2004. Transient Current Testing of Dynamic CMOS Circuits. Proceedings IEEE 19th International Symposium on Defect and Fault Tolerance in VLSI Systems. 2004. pp.264–271.
2. Bollinger, S and Midkiff, S. 1991. On test Generation for IDDQ Testing of Bridging Faults in CMOS Circuits. Proceedings International Test Conference. 1991. pp.598–607.
3. Detecting bridging faults in dynamic CMOS circuits