Effects of External Operating Conditions on the Reverse Recovery Behaviour of Fast Power Diodes-Reference-Cited by-同舟云学术

Effects of External Operating Conditions on the Reverse Recovery Behaviour of Fast Power Diodes

Published:1999-06 Issue:1-2 Volume:8 Page:11-18
ISSN:0939-8368
Container-title:EPE Journal
language:en
Short-container-title:EPE Journal

Author:

Shammas N.Y.A.,Rahimo M.T.,Hoban P.T.

Publisher

Informa UK Limited

Subject

Electrical and Electronic Engineering

Link

http://www.tandfonline.com/doi/pdf/10.1080/09398368.1998.11463420

Reference6 articles.

1. Somos Commutation and destructive oscillation in diode circuits, AlEE Trans Comun. Elec., pp. 162–173. May 1961.

2. Hoban P., Rithimo M., Shammas N.Y. A.: Electrical Transient of snubber diodes in GTO circuits, EPE 93’ Conf., Brighton. U.K., pp 368–373, Sept. 1993

3. Benda V., Kang Ch. H., Klabbacka: A note on the charge analysis approach of power diodes reverse recovery, ISPS 94, Czech Rep, pp. 67–60. Aug. 1994.

4. Benda V.: Design Considerations for Fast Soft Reverse Recovery Diodes. EPE 93 Conf., Brighton. U.K., pp. 288–292, Sept. 1993.

5. Ralihno M. T., Shammas N. Y. A.: Emitter Design Effects on Soft/Snappy Recovery in Modern Fast Power Diodes. 3rd International Seminar on Power Semiconductors ISPS’96 Prague, Czech Rep., pp. 65–71, Sept. 1996.

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