Enhancing primary processing for small-angle X-ray scattering-Reference-Cited by-同舟云学术

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Enhancing primary processing for small-angle X-ray scattering

Published:2016-06-30 Issue:1 Volume:45 Page:22-34
ISSN:1073-9149
Container-title:Instrumentation Science & Technology
language:en
Short-container-title:Instrumentation Science & Technology

Author:

Wei Yanru,Li Zhihong

Funder

National Foundation of Natural Science of China

State Key Laboratory for Coal Resources and Safe Mining, China University of Mining & Technology

Publisher

Informa UK Limited

Subject

General Environmental Science,Instrumentation,General Chemical Engineering

Link

http://www.tandfonline.com/doi/pdf/10.1080/10739149.2016.1205084

Reference18 articles.

1. Glatter, O.; Kratky, O.Small Angle X-ray Scattering; Academic Press: London, New York, 1982; 17–52.

2. Experimental practice and data processing

3. A double area detector system for simultaneous small and wide-angle X-ray scattering

4. Data Treatment

5. A program for SAXS data processing and analysis

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