Process Yield for a Manufactured Product-Reference-Cited by-同舟云学术

Process Yield for a Manufactured Product

Published:2013-01 Issue:4 Volume:10 Page:483-494
ISSN:1684-3703
Container-title:Quality Technology & Quantitative Management
language:en
Short-container-title:Quality Technology & Quantitative Management

Author:

Wang Fu-Kwun,Chu Darcy

Publisher

Informa UK Limited

Subject

Management of Technology and Innovation,Information Systems and Management,Management Science and Operations Research,Industrial relations,Business and International Management

Link

http://www.tandfonline.com/doi/pdf/10.1080/16843703.2013.11673426

Reference3 articles.

1. IMSL (1995).Version 4.0.Houston, Texas: Microsoft Fortran Power Station.

2. Johnson, R. A. and Wichern, D. W. (2007).Applied Multivariate Statistical Analysis.Englewood Cliffs: Prentice Hall.

3. Mardia, K. V. (1980). Tests for univariate and multivariate normality. InThe Handbook of Statistics(pp. 279-320). North-Holland, New York.

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