Partial accelerated degradation test plans for Wiener degradation processes-Reference-Cited by-同舟云学术

Partial accelerated degradation test plans for Wiener degradation processes

Published:2017-08-29 Issue:1 Volume:16 Page:67-81
ISSN:1684-3703
Container-title:Quality Technology & Quantitative Management
language:en
Short-container-title:Quality Technology & Quantitative Management

Author:

Lim Heonsang¹^ORCID,Kim Yong Soo²,Bae Suk Joo³,Sung Si-Il⁴^ORCID

Affiliation:

1. Quality Assurance, Memory Business, Samsung Electronics, Hwaseong, Korea

2. Department of Industrial and Management Engineering, Kyonggi University, Suwon, Korea

3. Department of Industrial Engineering, Hanyang University, Seoul, Korea

4. Department of Industrial and Management Engineering, Inje University, Gimhae, Korea

Publisher

Informa UK Limited

Subject

Management of Technology and Innovation,Information Systems and Management,Management Science and Operations Research,Industrial relations,Business and International Management

Link

https://www.tandfonline.com/doi/pdf/10.1080/16843703.2017.1368968

Reference40 articles.

1. Optimal design of partially accelerated life tests for the exponential distribution under type-I censoring

2. Experimental Design for a Class of Accelerated Degradation Tests

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