RELATION BETWEEN PROCESSING, MICROSTRUCTURE AND ELECTRIC FIELD-DEPENDENT DIELECTRIC PROPERTIES OF Ba0.3Sr0.7TiO3 THIN FILMS ON ALUMINA SUBSTRATES-Reference-Cited by-同舟云学术

RELATION BETWEEN PROCESSING, MICROSTRUCTURE AND ELECTRIC FIELD-DEPENDENT DIELECTRIC PROPERTIES OF Ba0.3Sr0.7TiO3 THIN FILMS ON ALUMINA SUBSTRATES

Published:2007-12-11 Issue:1 Volume:93 Page:119-125
ISSN:1058-4587
Container-title:Integrated Ferroelectrics
language:en
Short-container-title:Integrated Ferroelectrics

Author:

MALIC BARBARA¹,VUKADINOVIC MISO¹²,BOERASU IULIAN¹,MANDELJC MIRA¹,ION ELENA¹,KOSEC MARIJA¹,SHERMAN VLADIMIR³,YAMADA TOMOAKI³,SETTER NAVA³

Affiliation:

1. a Jozef Stefan Institute , Jamova 39, 1000 , Ljubljana , Slovenia

2. b HYB d.o.o. , Trubarjeva 7, 8310 , Sentjernej , Slovenia

3. c Ceramics Laboratory , Swiss Federal Institute of Technology , EPFL, CH-1015 , Lausanne , Switzerland

Publisher

Informa UK Limited

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Ceramics and Composites,Control and Systems Engineering,Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1080/10584580701756334

Reference9 articles.

1. Thin-film ferroelectric microwave devices

2. Ferroelectric Materials for Microwave Tunable Applications

3. Control of the morphology of CSD-prepared (Ba,Sr)TiO3 thin films

4. Copper Compatible Barium Titanate Thin Films for Embedded Passives

5. Processing and dielectric characterization of Ba0.3Sr0.7TiO3 thin films on alumina substrates

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Structural and dielectric properties of epitaxial (Ba,Sr)TiO3 films on c-Al2O3 with ultra-thin TiN sacrificial template;Journal of the Ceramic Society of Japan;2011

2. Modelling and characterization of thin film planar capacitors: inherent errors and limits of applicability of partial capacitance methods;Measurement Science and Technology;2009-09-25

3. Reliability study of tunable ferroelectric capacitors;Journal of Applied Physics;2008-09-15