LOW TEMPERATURE CRYSTALLIZATION OF Pb(Zr,Ti)O3 AND PbTiO3 MOCVD THIN FILM BY HYDROTHERMAL TREATMENT AT 240°C-Reference-Cited by-同舟云学术

LOW TEMPERATURE CRYSTALLIZATION OF Pb(Zr,Ti)O3 AND PbTiO3 MOCVD THIN FILM BY HYDROTHERMAL TREATMENT AT 240°C

Published:2006-11 Issue:1 Volume:84 Page:137-146
ISSN:1058-4587
Container-title:Integrated Ferroelectrics
language:en
Short-container-title:Integrated Ferroelectrics

Author:

NAOYAMA TAKUJI¹,NODA MINORU¹,OKUYAMA MASANORI¹,FUJISAWA HIRONORI²,SHIMIZU MASARU²,SAITO KEISUKE³

Affiliation:

1. a Graduate School of Engineering Science , Osaka University, 1-3 Machikaneyama-Cho , Toyonaka, Osaka, 560-8531, Japan

2. b University of Hyogo, 2167 Shosya , Himeji, 671-2201, Hyogo, Japan

3. c BURUKER AXS K.K., 3-9-A Moriya-cho, Kanagawa-ku , Yokohama-shi, 221-0022, Kanagawa, Japan

Publisher

Informa UK Limited

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Ceramics and Composites,Control and Systems Engineering,Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1080/10584580601085495

Reference9 articles.

1. A Low Temperature Preparation of BaTiO3Thin Film by Sol-Gel-Hydrothermal Treatment below 210°C

2. Step Coverage Characteristics ofPb(Zr,Ti)O3Thin Films on Various Electrode Materials by Metalorganic Chemical Vapor Deposition

3. Low-Temperature Fabrication of Ir/Pb(Zr,Ti)O3/Ir Capacitors Solely by Metalorganic Chemical Vapor Deposition

4. Method of Distinguishing SrBi2Ta2O9Phase from Fluorite Phase Using X-Ray Diffraction Reciprocal Space Mapping

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