Evaluation of Residual Stress in Thin Ferroelectric Films Using Grazing Incident X-Ray Diffraction-Reference-Cited by-同舟云学术

Evaluation of Residual Stress in Thin Ferroelectric Films Using Grazing Incident X-Ray Diffraction

Published:2004-01 Issue:1 Volume:63 Page:183-189
ISSN:1058-4587
Container-title:Integrated Ferroelectrics
language:en
Short-container-title:Integrated Ferroelectrics

Author:

PETROV Peter KR.¹,SARMA KUMARAVINOTHAN¹,ALFORD NEIL MCN.¹

Affiliation:

1. a Centre for Physical Electronics and Materials, Faculty of Engineering, Science and Technology, South Bank University , 103 Borough Road, London, UK , SE1 0AA

Publisher

Informa UK Limited

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Ceramics and Composites,Control and Systems Engineering,Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1080/10584580490459431

Reference5 articles.

1. The effect of strain on the permittivity of SrTiO3 from first-principles study

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