Origin of voltage offset and built-in polarization in in-situ sputter deposited pzt thin films-Reference-Cited by-同舟云学术

Origin of voltage offset and built-in polarization in in-situ sputter deposited pzt thin films

Published:2001-01 Issue:1-4 Volume:36 Page:83-92
ISSN:1058-4587
Container-title:Integrated Ferroelectrics
language:en
Short-container-title:Integrated Ferroelectrics

Author:

Hiboux Stephane¹,Muralt Paul¹

Affiliation:

1. a Ceramics Laboratory , Swiss Federal Institute of Technology (EPFL) , CH-1015, Lausanne, Switzerland

Publisher

Informa UK Limited

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Ceramics and Composites,Control and Systems Engineering,Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1080/10584580108015530

Reference17 articles.

1. Voltage offsets in (Pb,La)(Zr,Ti)O3 thin films

2. Preparation of epitaxial Pb(ZrxTi1−x)O3thin films and their crystallographic, pyroelectric, and ferroelectric properties

3. Influence of Zr/Ti ratios on the deformation in the hysteresis loop of Pb(Zr,Ti)O3 thin film capacitors

4. Built-in voltages and asymmetric polarization switching in Pb(Zr,Ti)O3 thin film capacitors

5. Electrical after-effects in Pb(Ti, Zr)O3 ceramics

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