IN SITU MEASUREMENTS OF STRESS WITH TEMPERATURE IN THIN FILM PbxBa1 − xTiO3-Reference-Cited by-同舟云学术

IN SITU MEASUREMENTS OF STRESS WITH TEMPERATURE IN THIN FILM PbxBa1 − xTiO3

Published:2006-11 Issue:1 Volume:83 Page:155-164
ISSN:1058-4587
Container-title:Integrated Ferroelectrics
language:en
Short-container-title:Integrated Ferroelectrics

Author:

BOYD D. A.¹,EL-NAGGAR M. Y.¹,GOODWIN D. G.¹

Affiliation:

1. a Division of Engineering and Applied Sciences , California Institute of Technology, MS 104-44 , Pasadena, 91125, CA

Publisher

Informa UK Limited

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Ceramics and Composites,Control and Systems Engineering,Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1080/10584580600950822

Reference23 articles.

1. Domain configurations due to multiple misfit relaxation mechanisms in epitaxial ferroelectric thin films. I. Theory

2. Thermodynamics of polydomain heterostructures. III. Domain stability map

3. Thermodynamic theory of epitaxial ferroelectric thin films with dense domain structures

4. Domain configurations due to multiple misfit relaxation mechanisms in epitaxial ferroelectric thin films. II. Experimental verification and implications

5. Relative coherency strain and phase transformation history in epitaxial ferroelectric thin films

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1. Effects of strontium and calcium simultaneous substitution on electrical and structural properties of Pb1−x−y Ca x Sr y TiO3 thin films;Applied Physics A;2009-03-03

2. Leakage current, ferroelectric and structural properties in Pb1−xBaxTiO3 thin films prepared by chemical route;Journal of Physics and Chemistry of Solids;2008-11