Diffuse scattering data acquisition techniques
Author:
Publisher
Informa UK Limited
Subject
General Materials Science,Instrumentation
Link
http://www.tandfonline.com/doi/pdf/10.1080/01411599808219193
Reference30 articles.
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2. X-ray diffraction study of the stacking faults in hexagonal C 70 single crystals
3. The φ Extent of the Reflection Range in the Oscillation Method According to the Mosaicity-Cap Model
4. The point-spread function of X-ray image-intensifiers/CCD-camera and imaging-plate systems in crystallography: assessment and consequences for the dynamic range
5. Resolution corrections in diffuse scattering experiments
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