Accurately estimated the complex relative permittivity of materials using a super high-resolution algorithm at X-band microwave propagation
Author:
Affiliation:
1. Faculty of Electronics and Telecommunications, Electric Power University, Ha Noi, Vietnam
2. State Key Laboratory of Millimeter Waves, Southeast University, Nanjing, P. R. China
Publisher
Informa UK Limited
Subject
Electrical and Electronic Engineering,Radiation,Electronic, Optical and Magnetic Materials
Link
https://www.tandfonline.com/doi/pdf/10.1080/02726343.2019.1695086
Reference17 articles.
1. New Interference Technique for Determination of Low Loss Material Permittivity in the Extremely High Frequency Range
2. A free-space method for measurement of dielectric constants and loss tangents at microwave frequencies
3. Free-space measurement of complex permittivity and complex permeability of magnetic materials at microwave frequencies
4. Geometrical Optics-Based Model for Dielectric Constant and Loss Tangent Free-Space Measurement
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1. The Performance of a High-Resolution Algorithm for Estimating the Complex Relative Permittivity of Materials at X-band Using the Transmission/Reflection Method in Free-Space;2023 Asia Meeting on Environment and Electrical Engineering (EEE-AM);2023-11-13
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