Application of electron optical techniques to the study of amorphous materials-Reference-Cited by-同舟云学术

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Application of electron optical techniques to the study of amorphous materials

Published:2010-12-14 Issue:35-36 Volume:90 Page:4647-4660
ISSN:1478-6435
Container-title:Philosophical Magazine
language:en
Short-container-title:Philosophical Magazine

Author:

Howie A.

Publisher

Informa UK Limited

Subject

Condensed Matter Physics

Link

http://www.tandfonline.com/doi/pdf/10.1080/14786431003636105

Reference47 articles.

1. High resolution electron microscopy of amorphous thin films

2. The Study of Nanovolumes of Amorphous Materials Using Electron Scattering

3. Variable Coherence Microscopy: a Rich Source of Structural Information from Disordered Materials

4. Fluctuation microscopy: a probe of medium range order

Cited by 10 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Detection of Ring and Adatom Defects in Activated Disordered Carbon via Fluctuation Nanobeam Electron Diffraction;Small;2020-05-08

2. An X-ray ptycho-tomography model of `Seeing order in ``amorphous'' materials';Ultramicroscopy;2019-08

3. Hybrid Reverse Monte Carlo and electron phase contrast image simulations of amorphous silicon with and without paracrystals;Molecular Simulation;2015-08-26

4. Formation and structure of V–Zr amorphous alloy thin films;Acta Materialia;2015-01

5. Solid-Phase Epitaxy;Handbook of Crystal Growth;2015

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