Determination of a rigid shift across the al(001)-gaas(001) interface-Reference-Cited by-同舟云学术

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Determination of a rigid shift across the al(001)-gaas(001) interface

Published:1992-08 Issue:2 Volume:66 Page:319-332
ISSN:0141-8610
Container-title:Philosophical Magazine A
language:en
Short-container-title:Philosophical Magazine A

Author:

Al-Khafaji M. A.,Cherns D.,Rossouw C. J.,Woolf D. A.

Publisher

Informa UK Limited

Subject

Metals and Alloys,Physics and Astronomy (miscellaneous),Condensed Matter Physics,General Materials Science,Electronic, Optical and Magnetic Materials

Link

http://www.tandfonline.com/doi/pdf/10.1080/01418619208201559

Reference19 articles.

1. Effects of thermal diffuse scattering and surface tilt on diffraction and channeling of fast electrons in CdTe

2. Absorptive form factors for high-energy electron diffraction

3. Misfit dislocations in heteroepitaxy

4. Electron diffraction from epitaxial crystals—a convergent-beam electron diffraction of the interface structure for NiSi2/Si and Al/GaAs

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Transmission electron microscopy study of metallic multilayers;Scripta Materialia;2004-03

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