Optical Characterisation of a Three Layer Waveguide Structure by m-Lines Spectroscopy
Author:
Publisher
Informa UK Limited
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://www.tandfonline.com/doi/pdf/10.1080/00150190701354927
Reference14 articles.
1. Electro-optic characterization of (Pb, La)TiO3 thin films using prism-coupling technique
2. Theory of Prism–Film Coupler and Thin-Film Light Guides
3. Theory of the Prism–Film Coupler by Plane-Wave Analysis
4. Measurement of Thin Film Parameters with a Prism Coupler
5. Formation of Light-Guiding Interconnections in an Integrated Optical Circuit by Composite Tapered-Film Coupling
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