Maximizing the expected remaining useful lifetime of a weakly controlled device-Reference-Cited by-同舟云学术

Maximizing the expected remaining useful lifetime of a weakly controlled device

Published:2019-09-05 Issue:9 Volume:52 Page:1588-1597
ISSN:0305-215X
Container-title:Engineering Optimization
language:en
Short-container-title:Engineering Optimization

Author:

Lefebvre Mario¹

Affiliation:

1. Department of Mathematics and Industrial Engineering, Polytechnique Montréal, Montréal, Canada

Funder

Natural Sciences and Engineering Research Council of Canada

Publisher

Informa UK Limited

Subject

Applied Mathematics,Industrial and Manufacturing Engineering,Management Science and Operations Research,Control and Optimization,Computer Science Applications

Link

https://www.tandfonline.com/doi/pdf/10.1080/0305215X.2019.1660775

Reference12 articles.

1. Ghamlouch, H., A. Grall, and M. Fouladirad. 2015. “On the Use of Jump-Diffusion Process for Maintenance Decision-Making: A First Step.” In Proceedings of the 2015 Annual Reliability and Maintainability Symposium (RAMS), 1–6. Piscataway, NJ: IEEE. doi:10.1109/RAMS.2015.7105099.

2. Lefebvre, M. 2017. “Mean of a First-Passage Time for a Two-Dimensional Diffusion Process.” Paper presented at the 10th International Conference on Mathematical Methods in Reliability (MMR 2017), Grenoble, France, July 3–6.

3. Lefebvre, M. 2018. “A Two-Dimensional Diffusion Process as a Degradation Model.” Paper presented at the 54th ESReDA Seminar, Nantes, France, April 25–26.

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