Evidence of equilibrium native defect populations in amorphous chalcogenides from analyses of xerographic spectra
Author:
Affiliation:
1. a Xerox Corporation , Webster , New York , 14580 , U.S.A
Publisher
Informa UK Limited
Subject
General Physics and Astronomy,General Chemical Engineering
Link
https://www.tandfonline.com/doi/pdf/10.1080/13642817408246507
Reference12 articles.
1. XEROGRAPHIC SPECTROSCOPY OF LOCALIZED ELECTRONIC STATES IN AMORPHOUS SEMICONDUCTORS
2. Xerographic spectroscopy of gap states in amorphous semiconductors
3. Photoenhanced metastable deep trapping in amorphous chalcogenides near room temperature
4. The effect of Te alloying on the electronic gap of a-Se
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