Quasi-optimization approach for millimeter wave imaging of multilayered dielectric media
Author:
Affiliation:
1. Department of Electrical Engineering, Indian Institute of Technology, Kanpur, India
2. Department of Electronics and Telecommunication Engineering, International Institute of Information Technology, Bhubaneswar, India
Publisher
Informa UK Limited
Subject
Electrical and Electronic Engineering,General Physics and Astronomy,Electronic, Optical and Magnetic Materials
Link
https://www.tandfonline.com/doi/pdf/10.1080/09205071.2018.1503566
Reference19 articles.
1. Microwave Electronics
2. Complex Permittivity Determination of Lossy Materials at Millimeter and Terahertz Frequencies Using Free-Space Amplitude Measurements
3. Nondestructive measurement of complex permittivity by a microwave technique: detection of contamination and food quality
4. Dielectric constant measurement of materials by a microwave technique: application to the characterization of vegetation leaves
5. Renormalization of an inverse-scattering theory for inhomogeneous dielectrics
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