Processing, basic characterization and standard dielectric measurements on PLZTx/65/35 (4 ≤x≤ 11) ceramics
Author:
Publisher
Informa UK Limited
Subject
General Materials Science,Instrumentation
Link
http://www.tandfonline.com/doi/pdf/10.1080/01411594.2014.953520
Reference20 articles.
1. Prediction of the crystal structures of perovskites using the software program SPuDS
2. Ferroelectric Ceramics: History and Technology
3. PLZT—Synthesis, sintering and ceramics microstructure
4. Raman and dielectric study of Ba0.4Sr0.6TiO3–MgAl2O4 tunable microwave composite
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