Frequency domain interferometry for measuring ultrafast refractive index modulation and surface deformation-Reference-Cited by-同舟云学术

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Frequency domain interferometry for measuring ultrafast refractive index modulation and surface deformation

Published:2022-04-26 Issue:1 Volume:7 Page:
ISSN:2374-6149
Container-title:Advances in Physics: X
language:en
Short-container-title:Advances in Physics: X

Author:

Tamming Ronnie R.¹²³⁴⁵,Hodgkiss Justin M.³⁵,Chen Kai¹²³⁴

Affiliation:

1. Wellington UniVentures, Victoria University of Wellington, Wellington, New Zealand

2. Robinson Research Institute, Faculty of Engineering, Victoria University of Wellington, Wellington, New Zealand

3. MacDiarmid Institute for Advanced Materials and Nanotechnology, Wellington, New Zealand

4. The Dodd-Walls Centre for Photonic and Quantum Technologies, Dunedin, New Zealand

5. School of Chemical and Physical Sciences, Victoria University of Wellington, Kelburn, New Zealand

Funder

Marsden Fund

Publisher

Informa UK Limited

Subject

General Physics and Astronomy

Link

https://www.tandfonline.com/doi/pdf/10.1080/23746149.2022.2065218

Reference122 articles.

1. The Optical Constants of Solution‐Processed Semiconductors—New Challenges with Perovskites and Non‐Fullerene Acceptors

2. The Impact of Core/Shell Sizes on the Optical Gain Characteristics of CdSe/CdS Quantum Dots

3. Performance enhancement of thin film silicon solar cells based on distributed Bragg reflector & diffraction grating

4. Principles of Optics

5. Refractive index extraction and thickness optimization of Cu2 ZnSnSe4 thin film solar cells

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1. Quantitative Complex Refractive Index Changes in Thin Films: A Pump–Probe Spectroscopy Analysis Approach;The Journal of Physical Chemistry Letters;2024-06-13

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3. Ultrafast optical properties and applications of anisotropic 2D materials;Nanophotonics;2024-01-02

4. Pump-probe phase spectroscopy with submilliradian sensitivity and nanosecond time delay using Michelson interferometers;Optics Express;2023-04-17

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