Scanning auger electron microscopy at 30 nm resolution-Reference-Cited by-同舟云学术

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Scanning auger electron microscopy at 30 nm resolution

Published:1976-09 Issue:3 Volume:34 Page:495-500
ISSN:0031-8086
Container-title:Philosophical Magazine
language:en
Short-container-title:Philosophical Magazine

Author:

Venables J. A.,Janssen A. P.,Harland C. J.,Joyce B. A.

Publisher

Informa UK Limited

Link

http://www.tandfonline.com/doi/pdf/10.1080/14786437608222040

Reference11 articles.

1. Bishop, H. E. 1974. A.E.R.E. Rep., No. 7899

2. Estimates of the Efficiencies of Production and Detection of Electron‐Excited Auger Emission

3. Brandis, E. K. 1975. 141 IITRI/SEM/1975

4. Christou, A. 1975. 149 IITRI/SEM/1975

5. Joy, D. C. 1974.Advances in Analysis of Microstructural Features by Electron Beam Techniques, 20London: Metals Society.

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