On the possibility of the direct imaging of point defects in crystals using transmission electron microscopy
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Publisher
Informa UK Limited
Link
http://www.tandfonline.com/doi/pdf/10.1080/14786437708235991
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4. Zusammenstellung der Koeffizienten für die Anpassung komplexer atomarer Streufaktoren für schnelle Elektronen durch Polynome 1. Mitteilung: Hartree-Fock-Fall
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1. Detection of a Point Defect in a Silicon Single Crystal by a Subtraction Method using High-Resolution Transmission Electron Microscopy;Acta Crystallographica Section A Foundations of Crystallography;1996-03-01
2. Theoretical and observed electron microscope images of impurity atoms in thin crystals formed by L-shell ionization electrons;Ultramicroscopy;1994-11
3. High-resolution electron microscopy of interfaces and surfaces;Ultramicroscopy;1987-01
4. Improving Signal-to-Noise Limits in High Resolution Transmission Electron Microscopy;MRS Proceedings;1986
5. Electron microscope observation of the structure and behaviour of stacking fault tetrahedra and single vacancies in gold crystals irradiated by 2 MeV electrons;physica status solidi (a);1985-01-16
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