Dislocation networks in phosphorus-implanted silicon-Reference-Cited by-同舟云学术

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Dislocation networks in phosphorus-implanted silicon

Published:1977-03 Issue:3 Volume:35 Page:663-691
ISSN:0031-8086
Container-title:Philosophical Magazine
language:en
Short-container-title:Philosophical Magazine

Author:

Tamuka Masao

Publisher

Informa UK Limited

Link

http://www.tandfonline.com/doi/pdf/10.1080/14786437708235998

Reference28 articles.

1. Amelinckx, S. 1964.The Direct Observation of Dislocations322London, New York: Academic Press. (), p.

2. Contrast from large prismatic dislocation loops

3. Diffraction contrast analysis of two-dimensional defects present in silicon after annealing

4. Investigations of dislocation strain fields using weak beams

Cited by 57 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Critical Evaluation and Thermodynamic Re-Optimization of the Si–P and Si–Fe–P Systems;Materials;2023-05-31

2. Frank network of dislocations within Mindlin’s second strain gradient theory of elasticity;International Journal of Mechanical Sciences;2019-12

3. Binary Phase Diagrams and Thermodynamic Properties of Silicon and Essential Doping Elements (Al, As, B, Bi, Ga, In, N, P, Sb and Tl);Materials;2017-06-20

4. Modeling of Thermodynamic Properties and Phase Equilibria of the Si-P System;Journal of Phase Equilibria and Diffusion;2013-11-06

5. Thermodynamic Calculations for the Dephosphorization of Silicon Using Molten Slag;JOM;2012-07-26

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