Ion Implantation Standards as a Spark Source Mass Spectrometric Surface Analysis Calibration Technique: The Analysis of B in Irradiated Zircaloy-2-Reference-Cited by-同舟云学术

Ion Implantation Standards as a Spark Source Mass Spectrometric Surface Analysis Calibration Technique: The Analysis of B in Irradiated Zircaloy-2

Published:1979-01 Issue:10 Volume:12 Page:1123-1135
ISSN:0003-2719
Container-title:Analytical Letters
language:en
Short-container-title:Analytical Letters

Author:

Christie W. H.,Carter J. A.,Eby R. E.,Landau L.

Publisher

Informa UK Limited

Subject

Electrochemistry,Biochemistry (medical),Clinical Biochemistry,Spectroscopy,Biochemistry,Analytical Chemistry

Link

http://www.tandfonline.com/doi/pdf/10.1080/00032717908082540

Reference7 articles.

1. Ahearn, A. J. 1967.Trace Characterization, Chemical and Physical, National Bureau of Standards Monograph 100 Edited by: Wayne Meinke, W. and Schribner, Bourdan F. 347–384. Washington, D. C.: U. S. Department of Commerce.

2. Spark-Source Mass Spectrometric Techniques for the Analysis of Lanthanide and Actinide Elements in Microgram and Sub-Microgram Transuranium Samples

3. Techniques of Quantitative Spectrographic Analysis

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Analysis of High-Purity Indium by Spark Source Mass Spectrometry;Bulletin des Sociétés Chimiques Belges;2010-09-01

2. Spark-source mass spectrometry: recent developments and applications. A review;The Analyst;1984

3. Recent developments in spark source mass spectrometry SSMS;International Journal of Mass Spectrometry and Ion Physics;1982-12

4. Use of implanted samples as standards in spark-source mass spectrometry with application to the analysis of III—V semiconductors;Analytica Chimica Acta;1982-03

5. Ion-implanted reference standards for use in microchemical analysis of materials;Mikrochimica Acta;1981-09