Preparation of a macrocrystalline pressure calibrant SrB4O7:Sm2+suitable for the HP-HTpowder diffraction
Author:
Publisher
Informa UK Limited
Subject
Condensed Matter Physics
Link
http://www.tandfonline.com/doi/pdf/10.1080/08957959.2013.819098
Reference7 articles.
1. High‐pressure measurements at moderate temperatures in a diamond anvil cell with a new optical sensor: SrB4O7:Sm2+
2. Improved calibration of the SrB4O7:Sm2+ optical pressure gauge: Advantages at very high pressures and high temperatures
3. The valence change from RE3+ to RE2+ (REEu, Sm, Yb) in SrB4O7: RE prepared in air and the spectral properties of RE2+
4. SrB4O7 ∶ Sm2+: crystal chemistry, Czochralski growth and optical hole burning
5. Larson AC, Von Dreele RB. General structure analysis system (GSAS). Report LAUR 86-748, Los Alamos National Lab, New Mexico; 2000.
Cited by 16 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Single-standard method for simultaneous pressure and temperature estimation using Sm2+:SrB4O7 fluorescence;Journal of Applied Physics;2018-10-28
2. Compressibility and reversible amorphization of thaumasite Ca3Si(OH)6(CO3)(SO4)·12H2O pressurized in methanol–ethanol–H2O up to 5 GPa;Physics and Chemistry of Minerals;2017-08-14
3. High-pressure Raman study of nyerereite from Oldoinyo Lengai;Journal of Raman Spectroscopy;2017-04-17
4. Structural behavior of Tl-exchanged natrolite at high pressure depending on the composition of pressure-transmitting medium;Physics and Chemistry of Minerals;2017-04-08
5. High-Pressure–High Temperature (HP-HT) Stability of Polytetrafluoroethylene: Raman Spectroscopic Study Up to 10 GPa and 600 ℃;Applied Spectroscopy;2017-02-14
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3