1. Defect mitigation by ion induced amorphousization and solid-phase epitaxy;AIP Conference Proceedings;2013
2. High resolution energy analyzer for broad ion beam characterization;Review of Scientific Instruments;2008
3. Compensation of the volume charge of ions in a time-of-flight mass analyzer;Technical Physics;2007-11
4. Ion Implantation;Handbook of Semiconductor Manufacturing Technology, Second Edition;2007-07-09
5. Mass and energy analysis of the ions in a plasma flood system;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2005-08