Investigation of point defects in silicon and germanium by non-irradiation techniques

Author:

Seeger A.

Publisher

Informa UK Limited

Subject

General Engineering

Reference37 articles.

1. Diffusion Mechanisms and Point Defects in Silicon and Germanium

2. Kendall, D. L. and De Vries, D. B. 1969.Semiconductor Silicon, Edited by: Haberecht, R. R. 358New York: The Electrochemical Society, Inc.

3. Self‐Diffusion in Intrinsic and Extrinsic Silicon

4. Seeger, A. and Swanson, M. L. 1968.Lattice Defects in Semiconductors, Edited by: Hasiguti, R. R. 93University of Tokyo Press and The Pennsylvania State University Press.

Cited by 35 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Point Defects in Semiconductors;Physical Chemistry of Semiconductor Materials and Processes;2015-08-07

2. Extended Point Defects in Crystalline Materials: Ge and Si;Physical Review Letters;2013-04-08

3. Comparison of diffusion in amorphous Si–C–N and Si–B–C–N precursor-derived ceramics;Journal of Non-Crystalline Solids;2002-03

4. Physics of the formation of microdefects in dislocation-free monocrystals of float-zone silicon;Semiconductor Science and Technology;2002-01-11

5. Surface Defects and Bulk Defect Migration Produced by Ion Bombardment of Si(001);Physical Review Letters;1999-12-06

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3