Application of characteristic secondary ion mass spectra to a depth analysis of copper oxide on copper-Reference-Cited by-同舟云学术

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Application of characteristic secondary ion mass spectra to a depth analysis of copper oxide on copper

Published:1973-01 Issue:3-4 Volume:18 Page:269-273
ISSN:0033-7579
Container-title:Radiation Effects
language:en
Short-container-title:Radiation Effects

Author:

Werner H. W.,De Grefte H. A. M.,Den Berg J. Van

Publisher

Informa UK Limited

Subject

General Engineering

Link

http://www.tandfonline.com/doi/pdf/10.1080/00337577308232134

Reference19 articles.

1. Ewald, H. and Hintenberger, H. 1953.Methoden und Anwendungen der Massenspektroskopie, 35–42. Weinheim/Berg-strasse: Verlag Chemie.

2. Barnard, G. P. 1953.Modern Mass Spectrometry, 192–230. London: The Institute of Physics.

3. Kienitz, H. 1968.Hrsg, Massenspektrometrie, 233–286. Weinheim/Bergstrasse: Verlag Chernie.

4. Ion Source for Mass Spectrography

5. Mass spectrometer for the study of sputtering

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2. Secondary ion mass spectrometry method for distinguishing the state of carbon in steels using negative molecular ions;Metallurgical Transactions A;1991-09

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