The spatial distribution of ions implanted into solids subject to diffusion and surface sputtering
Author:
Affiliation:
1. a Department of Mathematics , University of Salford , Salford , M5 4WT , Lancashire , U.K.
2. b Department of Electrical Engineering , University of Salford , Salford , M5 4WT , Lancashire , U.K.
Publisher
Informa UK Limited
Subject
General Engineering
Link
https://www.tandfonline.com/doi/pdf/10.1080/00337577508234749
Reference8 articles.
1. Ion Sorption in the Presence of Sputtering
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1. Rapid-relocation model for describing high-fluence retention of rare gases implanted in solids;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2009-09
2. Steady-state damage profiles due to reactive ion etching and ion-assisted etching;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;1995-03
3. Sputtering of compound semiconductor surfaces. I. Ion-solid interactions and sputtering yields;Critical Reviews in Solid State and Materials Sciences;1994-01
4. A study of enhanced diffusion during high dose high flux pulsed metal ion implantation into steel and aluminium;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1992-04
5. Elevated-temperature implantations of Au into Zr;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1991-07
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