Application of the Resonance Technique for the Evaluation of TE and TM Modes Guided by Successive Non-kerr Nonlinear Dielectric Planar Layer Structures-Reference-Cited by-同舟云学术

Application of the Resonance Technique for the Evaluation of TE and TM Modes Guided by Successive Non-kerr Nonlinear Dielectric Planar Layer Structures

Published:1993-05 Issue:5 Volume:40 Page:743-760
ISSN:0950-0340
Container-title:Journal of Modern Optics
language:en
Short-container-title:Journal of Modern Optics

Author:

Kanellopoulos J.D.,Stathopoulos N.A.

Publisher

Informa UK Limited

Subject

Atomic and Molecular Physics, and Optics

Link

http://www.tandfonline.com/doi/pdf/10.1080/09500349314550791

Reference25 articles.

1. Nonlinear waves guided by a dielectric slab

2. Calculations of nonlinear TE waves guided by thin dielectric films bounded by nonlinear media

3. Optically nonlinear waves in thin films

4. Generalized dispersion relations for nonlinear slab-guided waves

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