An Automatic Inspection Method for the Fracture Conditions of Anisotropic Conductive Film in the TFT-LCD Assembly Process
Author:
Publisher
Informa UK Limited
Subject
Electrical and Electronic Engineering,Mechanical Engineering,Instrumentation
Link
http://www.tandfonline.com/doi/pdf/10.1080/15599612.2011.604114
Reference18 articles.
1. Matching Graphs with Fuzzy Attributes in Machine Vision
2. The use of the Taguchi method with grey relational analysis to optimize the thin-film sputtering process with multiple quality characteristic in color filter manufacturing
3. A three-dimensional automated visual inspection system for SMT assembly
4. Incorporating ANNs and statistical techniques into achieving process analysis in TFT-LCD manufacturing industry
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